Shallow trench isolation double-diobe electrostatic...

Journal of Electrostatics 1993 Vol. 31; Iss. 2-3

Shallow trench isolation double-diobe electrostatic discharge circuit and interaction with DRAM output circuitry

Steven H. Voldman, Vaughn P. Gross, Michael J. Hargrove, James M. Never, James A. Slinkman, Martin P.O'Boyle, Tom S. Scott, Joseph J. Delecki
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Volume:
31
Year:
1993
Language:
english
Pages:
26
DOI:
10.1016/0304-3886(93)90011-u
File:
PDF, 1.79 MB
english, 1993
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