Volume 31; Issue 2-3

Journal of Electrostatics

Volume 31; Issue 2-3
1

Preface

Year:
1993
Language:
english
File:
PDF, 54 KB
english, 1993
4

ESD protection in a 3.3 V sub-micron silicided CMOS technology

Year:
1993
Language:
english
File:
PDF, 1.34 MB
english, 1993
5

Annealing of ESD-induced damage in power MOSFETs

Year:
1993
Language:
english
File:
PDF, 770 KB
english, 1993
8

On chip ESD protection using SCR pairs

Year:
1993
Language:
english
File:
PDF, 1.07 MB
english, 1993
9

From lightning to charged-device model electrostatic discharges

Year:
1993
Language:
english
File:
PDF, 748 KB
english, 1993
12

Fieldemitter-based ESD-protection circuits for high-frequency devices and IC's

Year:
1993
Language:
english
File:
PDF, 1.05 MB
english, 1993
13

Experimental study of unprotected MOS structures under EOS/ESD conditions

Year:
1993
Language:
english
File:
PDF, 959 KB
english, 1993
16

ESD induced gate oxide damage during wafer fabrication process

Year:
1993
Language:
english
File:
PDF, 792 KB
english, 1993
17

The resistive phase of an air discharge and the formation of fast risetime ESD pulses

Year:
1993
Language:
english
File:
PDF, 1001 KB
english, 1993
18

Calendar

Year:
1993
File:
PDF, 18 KB
1993
19

Author index volume 31

Year:
1993
Language:
english
File:
PDF, 89 KB
english, 1993
20

Contents volume 31

Year:
1993
Language:
english
File:
PDF, 74 KB
english, 1993
21

Subject index volume 31

Year:
1993
File:
PDF, 23 KB
1993
22

Panel of referees

Year:
1993
File:
PDF, 21 KB
1993
23

Submission of manuscripts by diskette

Year:
1993
File:
PDF, 27 KB
1993