Depth of information in photoelectron microscopy

Ultramicroscopy 1982 Vol. 7; Iss. 4

Depth of information in photoelectron microscopy

William A. Houle, Wilfried Engel, Frank Willig, Gertrude F. Rempfer, O.Hayes Griffith
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Volume:
7
Year:
1982
Language:
english
Pages:
10
DOI:
10.1016/0304-3991(82)90261-3
File:
PDF, 729 KB
english, 1982
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