Volume 7; Issue 4

Ultramicroscopy

Volume 7; Issue 4
1

Correction of aberrations in a magnetic spectrometer by electric multipole lenses

T.T. Tang
Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 290 KB
english, 1982
3

Surface activation of carbon film supports for biological electron microscopy

Ellen Namork, B.V. Johansen
Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 734 KB
english, 1982
4

Detection of objects in quantum-noise-limited images

Marin Van Heel
Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 928 KB
english, 1982
5

A method of alignment for convergent beam diffraction in TEM mode for a JEM-100C electron microscope

M.J. Witcomb
Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 577 KB
english, 1982
6

Investigations into sources of image instabilities

Alex P. Korn
Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 1.52 MB
english, 1982
7

Depth of information in photoelectron microscopy

William A. Houle, Wilfried Engel, Frank Willig, Gertrude F. Rempfer, O.Hayes Griffith
Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 729 KB
english, 1982
9

The single-scattering model and spatial resolution in X-ray analysis of thin foils

S.J.B. Reed
Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 287 KB
english, 1982
10

A simple and practical approach to correct spherical aberration in existing electron probe microscopes

Raj K. Garg
Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 242 KB
english, 1982
11

Author index to volume 7

Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 130 KB
english, 1982
12

Subject index to volume 7

Journal:
Ultramicroscopy
Year:
1982
Language:
english
File:
PDF, 195 KB
english, 1982