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High throughput high resolution vortex/Sup TM/ detector for x-ray diffraction
Iwanczyk, J.S., Patt, B.E., Barkan, S., Feng, L., Tull, C.R.Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2003.820627
Date:
December, 2003
File:
PDF, 415 KB
english, 2003