Structural and optoelectronic characterization of TiO...

Structural and optoelectronic characterization of TiO 2 films prepared using the sol–gel technique

González, A E Jiménez, Santiago, S Gelover
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Volume:
22
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/22/7/006
Date:
July, 2007
File:
PDF, 693 KB
english, 2007
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