Drain-Induced Barrier Lowering in Short-Channel Poly-Si TFT...

IEEE Electron Device Letters 2011 Vol. 32; Iss. 9

Drain-Induced Barrier Lowering in Short-Channel Poly-Si TFT After Off-Bias Stress Using Metal-Induced Crystallization of Amorphous Silicon

U. G. Lee, J. Jang
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Volume:
32
Year:
2011
Language:
english
DOI:
10.1109/LED.2011.2159475
File:
PDF, 397 KB
english, 2011
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