A Common Framework of NBTI Generation and Recovery in...

IEEE Electron Device Letters 2009 Vol. 30; Iss. 9

A Common Framework of NBTI Generation and Recovery in Plasma-Nitrided SiON p-MOSFETs

S. Deora, V. Maheta, A. Islam, M. Alam, S. Mahapatra
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Volume:
30
Year:
2009
Language:
english
DOI:
10.1109/LED.2009.2026436
File:
PDF, 251 KB
english, 2009
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