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Trends in Digital Device Test Methodologies
Crane, F. Edward, Davidson, Scott, Kane, Jack, Stroud, Charles E., Wu, ShianlingVolume:
73
Language:
english
Journal:
AT&T Technical Journal
DOI:
10.1002/j.1538-7305.1994.tb00574.x
Date:
March, 1994
File:
PDF, 2.51 MB
english, 1994