Volume 73; Issue 2

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AT&T Technical Journal
Volume 73; Issue 2

AT&T Technical Journal

Volume 73; Issue 2

1

Trends in Digital Device Test Methodologies

Crane, F. Edward, Davidson, Scott, Kane, Jack, Stroud, Charles E., Wu, Shianling

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 2.51 MB

english, 1994

2

Built-in Self-Test for Digital Integrated Circuits

Agrawal, Vishwani D., Lin, Chih-Jen, Rutkowski, Paul W., Wu, Shianling, Zorian, Yervant

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 4.64 MB

english, 1994

3

Environmental Stress Testing

Chan, H. Anthony, Englert, Paul J., Oien, Michael A., Rajaram, S. Raja

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 3.33 MB

english, 1994

4

Boundary-Scan Testing for Electronic Subassemblies and Systems

Yau, Chi W., Beausang, James, Crane, F. Edward, Jarwala, Najml T., Tulloss, Rodham E.

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 4.90 MB

english, 1994

5

Extending Design-for-Test Into the Analog and Mixed-Signal Domains

Lopresti, Philip V.

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 2.80 MB

english, 1994

6

Testing Goes Critical Path

Campbell, Richard L., Tarbox, Richard A.

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 2.37 MB

english, 1994

7

Non-Destructive Optical Techniques for Characterizing Semiconductor Materials and Devices

Carver, Gary E., Gray, Mary L., Levkoff, Jerome, Miller, Blair W., Phatak, Sunil B.

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 7.30 MB

english, 1994

8

Automatic Test Generation for Digital Electronic Circuits

Chakraborty, Tapan J., Davidson, Scott, Maamari, Fadi, Cheng, Kwang-Ting

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 4.33 MB

english, 1994

9

Ensuring Structural Testability of High-Density SMT Circuit Packs

Allen, Robert W., Calafiore, Robert L., Dyer, William W., Febo, Michael V., Sinclair, Timothy K.

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 4.13 MB

english, 1994

10

AT&T Innovation Briefs

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 286 KB

english, 1994

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