Built-in Self-Test for Digital Integrated Circuits

AT&T Technical Journal 1994 / 03 Vol. 73; Iss. 2

Built-in Self-Test for Digital Integrated Circuits

Agrawal, Vishwani D., Lin, Chih-Jen, Rutkowski, Paul W., Wu, Shianling, Zorian, Yervant
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Volume:
73
Language:
english
Journal:
AT&T Technical Journal
DOI:
10.1002/j.1538-7305.1994.tb00576.x
Date:
March, 1994
File:
PDF, 4.64 MB
english, 1994
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