Interplay Between Statistical Variability and Reliability...

IEEE Transactions on Electron Devices 2014 / 9 Vol. 61; Iss. 9

Interplay Between Statistical Variability and Reliability in Contemporary pMOSFETs: Measurements Versus Simulations

Hussin, Razaidi, Amoroso, Salvatore Maria, Gerrer, Louis, Kaczer, Ben, Weckx, Pieter, Franco, Jacopo, Vanderheyden, Annelies, Vanhaeren, Danielle, Horiguchi, Naoto, Asenov, Asen
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2336698
Date:
September, 2014
File:
PDF, 5.06 MB
english, 2014
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