Volume 61; Issue 9

IEEE Transactions on Electron Devices

Volume 61; Issue 9

1

Implementation of DPL-DD Model for the Simulation of Nanoscale MOS Devices

Moghaddam, Masood, Ghazanfarian, Jafar, Abbassi, Abbas

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.21 MB

english, 2014

2

Zigzag-Shaped Coil Array Structure for Wireless Chip-to-Chip Communication Applications

Changhyun Lee,, Jonghoon Park,, Changkun Park,

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.88 MB

english, 2014

3

Copper Solenoid Design for the Continuous Operation of a Second Harmonic 95-GHz Gyrotron

Borodin, Dmitri, Einat, Moshe

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.64 MB

english, 2014

4

Predictive Hot-Carrier Modeling of n-Channel MOSFETs

Bina, Markus, Tyaginov, Stanislav, Franco, Jacopo, Rupp, Karl, Wimmer, Yannick, Osintsev, Dmitry, Kaczer, Ben, Grasser, Tibor

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.05 MB

english, 2014

5

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

Wu, Qian, Bayerl, Albin, Porti, Marc, Martin-Martinez, Javier, Lanza, Mario, Rodriguez, Rosana, Velayudhan, Vikas, Nafria, Montserrat, Aymerich, Xavier, Gonzalez, Mireia Bargallo, Simoen, Eddy

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 874 KB

english, 2014

6

Interplay Between Statistical Variability and Reliability in Contemporary pMOSFETs: Measurements Versus Simulations

Hussin, Razaidi, Amoroso, Salvatore Maria, Gerrer, Louis, Kaczer, Ben, Weckx, Pieter, Franco, Jacopo, Vanderheyden, Annelies, Vanhaeren, Danielle, Horiguchi, Naoto, Asenov, Asen

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 5.06 MB

english, 2014

7

Microelectromechanical Relay and Logic Circuit Design for Zero Crowbar Current

Fujiki, Jun, Xu, Nuo, Hutin, Louis, Chen, I-Ru, Qian, Chuang, Liu, Tsu-Jae King

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.36 MB

english, 2014

8

Pulsed Power Combining System for W-Band Traveling Wave Tube Amplifiers With a Waveguide Combiner

Ge, Junxiang, Zhou, Yong, Yu, Bing, Zhu, Cheng, Zhou, Junping, Li, Jiaqiang, Wan, Fayu, Feng, Jinjun, Cai, Jun, Wu, Xianping

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.65 MB

english, 2014

9

Tri-Gate Graphene Nanoribbon Transistors With Transverse-Field Bandgap Modulation

Tung, Lieh-Ting, Veronica Mateus, Maria, Chihchuan Kan, Edwin

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.81 MB

english, 2014

10

Study of the Effect of the Electron Beam Parameters on a 0.4 THz Second Harmonic Gyrotron

Xinjian, Niu, Chaojun, Lei, Yinghui, Liu, Hongfu, Li

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.57 MB

english, 2014

11

Integration of Ni2Si/Si Nanograss Heterojunction on n-MOSFET to Realize High-Sensitivity Phototransistors

Taghinejad, Mohammad, Taghinejad, Hossein, Ganji, Mehran, Rostamian, Ali, Mohajerzadeh, Shamsoddin, Abdolahad, Mohammad, Kolahdouz, Mohammadreza

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.90 MB

english, 2014

12

Enhanced Dark Current Suppression of Amorphous Selenium Detector With Use of IGZO Hole Blocking Layer

Abbaszadeh, Shiva, Tari, Alireza, Wong, William S., Karim, Karim S.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 558 KB

english, 2014

13

High-Q Characteristics of Variable Width Inductors With Reverse Excitation

Vanukuru, Venkata Narayana Rao, Chakravorty, Anjan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.61 MB

english, 2014

14

Overestimation of Short-Channel Effects Due to Intergate Coupling in Advanced FD-SOI MOSFETs

Navarro, Carlos, Bawedin, Maryline, Andrieu, Francois, Cristoloveanu, Sorin

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.33 MB

english, 2014

15

CMOS Logic Device and Circuit Performance of Si Gate All Around Nanowire MOSFET

Nayak, Kaushik, Bajaj, Mohit, Konar, Aniruddha, Oldiges, Philip J., Natori, Kenji, Iwai, Hiroshi, Murali, Kota V. R. M., Rao, Valipe Ramgopal

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 5.35 MB

english, 2014

16

Infinite Output Resistance of Corbino Thin-Film Transistors With an Amorphous-InGaZnO Active Layer for Large-Area AMOLED Displays

Mativenga, Mallory, Ha, Su Hwa, Geng, Di, Kang, Dong Han, Mruthyunjaya, Ravi K., Heiler, Gregory N., Tredwell, Timothy J., Jang, Jin

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.83 MB

english, 2014

17

Quantum Modeling of the Carrier Mobility in FDSOI Devices

Nguyen, Viet-Hung, Niquet, Yann-Michel, Triozon, Francois, Duchemin, Ivan, Nier, Olivier, Rideau, Denis

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.30 MB

english, 2014

18

Characterization of DC-Stress-Induced Degradation in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

Zhang, Meng, Zhou, Wei, Chen, Rongsheng, Wong, Man, Kwok, Hoi-Sing

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 4.14 MB

english, 2014

19

Extraction of Gate Resistance in Sub-100-nm MOSFETs With Statistical Verification

Chen, Xuesong, Tsai, Mu Kai, Chen, Chih-Hung, Lee, Ryan, Chen, David C.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.67 MB

english, 2014

20

Ultrahigh Sensitivity Self-Amplification Phototransistor Achieved by Automatic Energy Band Lowering Behavior

Chen, Hua-Mao, Chang, Ting-Chang, Tai, Ya-Hsiang, Chen, Yu-Chun, Yang, Man-Chun, Chou, Cheng-Hsu, Chang, Jung-Fang, Deng, Shao-Zhi

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.33 MB

english, 2014

21

Germanium n+/p Shallow Junction With Record Rectification Ratio Formed by Low-Temperature Preannealing and Excimer Laser Annealing

Wang, Chen, Li, Cheng, Lin, Guangyang, Lu, Weifang, Wei, Jiangbin, Huang, Wei, Lai, Hongkai, Chen, Songyan, Di, Zengfeng, Zhang, Miao

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.71 MB

english, 2014

22

Modeling of Drain Electric Flux Passing Through the BOX Layer in SoI MOSFETs—Part I: Preparation for Modeling Based on Conformal Mapping

Yamada, Tatsuya, Hanajiri, Tatsuro, Toyabe, Toru

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.33 MB

english, 2014

23

Area and Energy Efficient High-Performance ZnO Wavy Channel Thin-Film Transistor

Hanna, Amir N., Ghoneim, Mohamed T., Bahabry, Rabab R., Hussain, Aftab M., Fahad, Hossain M., Hussain, Muhammad M.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.09 MB

english, 2014

24

Performance of a-SiGe:H Thin-Film Solar Cells on High-Heat Dissipation Flexible Ceramic Printable Circuit Board

Wang, Chao-Chun, Wu, Zong-Syun, Hsu, Chia-Hsun, Lien, Shui-Yang, Wuu, Dong-Sing, Han, Pin

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.90 MB

english, 2014

25

Position Sensitive Silicon Photomultiplier With Intrinsic Continuous Cap Resistive Layer

Li, Chenhui, Wang, Shenyuan, Huo, Linzhang, Wang, Yue, Liang, Kun, Yang, Ru, Han, Dejun

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 958 KB

english, 2014

26

Analysis of Time Dependent Electric Field Degradation in AlGaN/GaN HEMTs

Hodge, Michael D., Heller, Eric R., Vetury, Ramakrishna, Shealy, Jeffrey B.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.49 MB

english, 2014

27

A Study of Overlaying Dielectric Layer and Its Local Geometry Effects on TSV-Induced KOZ in 3-D IC

Tsai, Ming-Yi, Huang, Pu-Shan, Lin, Po-Chun

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.73 MB

english, 2014

28

Photosensing by Edge Schottky Barrier Height Modulation Induced by Lateral Diffusion Current in MOS(p) Photodiode

Lin, Yen-Kai, Hwu, Jenn-Gwo

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.31 MB

english, 2014

29

A Simulation Study of SoI-Like Bulk Silicon MOSFET With Improved Performance

Wang, Ying, He, Xiao-Wen, Shan, Chan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.47 MB

english, 2014

30

A New Model for the \(1/f\) Noise of Polycrystalline Silicon Thin-Film Transistors

Wang, Mingxiang, Wang, Ming

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.34 MB

english, 2014

31

Ion-Bombarded and Plasma-Passivated Charge Storage Layer for SONOS-Type Nonvolatile Memory

Liu, Sheng-Hsien, Wu, Chi-Chang, Yang, Wen-Luh, Lin, Yu-Hsien, Chao, Tien-Sheng

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.15 MB

english, 2014

32

Extension of Planar Bulk n-Channel MOSFET Scaling With Oxygen Insertion Technology

Xu, Nuo, Takeuchi, Hideki, Damrongplasit, Nattapol, Stephenson, Robert J., Huang, Xiangyang, Cody, Nyles W., Hytha, Marek, Mears, Robert J., Liu, Tsu-Jae King

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.99 MB

english, 2014

33

Observation of Shot Noise in Phosphorescent Organic Light-Emitting Diodes

Djidjou, Thaddee Kamdem, Bevans, Dieter Alexander, Li, Sergey, Rogachev, Andrey

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.32 MB

english, 2014

34

A Fast Technique to Screen Carrier Generation Lifetime Using DLTS on MOS Capacitors

Elhami Khorasani, Arash, Schroder, Dieter K., Alford, T. L.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.53 MB

english, 2014

35

A Compact Explicit Model for Long-Channel Gate-All-Around Junctionless MOSFETs. Part II: Total Charges and Intrinsic Capacitance Characteristics

Moldovan, Oana, Lime, Francois, Iniguez, Benjamin

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.40 MB

english, 2014

36

2-D Analytical Model for the Threshold Voltage of a Tunneling FET With Localized Charges

Vishnoi, Rajat, Kumar, M. Jagadesh

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.24 MB

english, 2014

37

Multifunction Behavior of a Vertical MOSFET With Trench Body Structure and New Erase Mechanism for Use in 1T-DRAM

Lin, Jyi-Tsong, Lin, Po-Hsieh

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.22 MB

english, 2014

38

Electrical Polarization Effects on the Optical Polarization Properties of AlGaN Ultraviolet Light-Emitting Diodes

Chang, Yi-An, Chen, Fang-Ming, Li, Shan-Rong, Kuo, Yen-Kuang

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.58 MB

english, 2014

39

Impact of Isolation-Feature Geometry on Self-Heating of AlGaN/GaN HFETs

Loghmany, Alireza, Valizadeh, Pouya, Record, Joseph

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.90 MB

english, 2014

40

Fast Ramped Voltage Characterization of Single Trap Bias and Temperature Impact on Time-Dependent \(V_{\rm TH}\) Variability

Toledano-Luque, Maria, Degraeve, Robin, Roussel, Philippe J., Ragnarsson, Lars-Ake, Chiarella, Thomas, Horiguchi, Naoto, Mocuta, Anda, Thean, Aaron

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.17 MB

english, 2014

41

Enhanced Performance of Single Poly-Silicon EEPROM Cell With a Tungsten Finger Coupling Structure by Full CMOS Process

Chung, Chih-Ping, Chang-Liao, Kuei-Shu, Chen, Chun-Yuan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.23 MB

english, 2014

42

An Analytical Model for the Forming Process of Conductive-Bridge Resistive-Switching Random-Access Memory

Lv, Shaoli, Wang, He, Zhang, Jinyu, Liu, Jun, Sun, Lingling, Life, Zhiping Yu

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.82 MB

english, 2014

43

Flexible Piezoelectric Energy Harvesting Circuit With Printable Supercapacitor and Diodes

Porhonen, Juho, Rajala, Satu, Lehtimaki, Suvi, Tuukkanen, Sampo

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.25 MB

english, 2014

44

A Compact Explicit Model for Long-Channel Gate-All-Around Junctionless MOSFETs. Part I: DC Characteristics

Lime, Francois, Moldovan, Oana, Iniguez, Benjamin

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.08 MB

english, 2014

45

Plasma Doping of InGaAs at Elevated Substrate Temperature for Reduced Sheet Resistance and Defect Formation

Kong, Eugene Y.-J., Subramanian, Sujith, D'Costa, Vijay Richard, Chua, Lye-Hing, Zou, Wei, Chan, Cleon, Henry, Todd, Yeo, Yee-Chia

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.57 MB

english, 2014

46

Comprehensive Studies on the Carrier Transporting Property and Photo-Bias Instability of Sputtered Zinc Tin Oxide Thin Film Transistors

Lee, Hong Woo, Yang, Bong Seob, Kim, Yoon Jang, Hwang, Ah Young, Oh, Seungha, Lee, Jong Hwan, Jeong, Jae Kyeong, Kim, Hyeong Joon

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.71 MB

english, 2014

47

A Highly Stable Biside Gate Driver Integrated by IZO TFTs

Wu, Wei-Jing, Song, Xiao-Feng, Zhang, Li-Rong, Zhou, Lei, Xu, Miao, Wang, Lei, Peng, Jun-Biao

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 882 KB

english, 2014

48

Modeling of Drain Electric Flux Passing Through the BOX Layer in SoI MOSFETs—Part II: Model Derivation and Validity Confirmation

Yamada, Tatsuya, Hanajiri, Tatsuro, Toyabe, Toru

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.34 MB

english, 2014

49

Thermal Transient Analysis of High-Power Green LED Fixed on BN Coated Al Substrates as Heatsink

Subramani, Shanmugan, Devarajan, Mutharasu

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 949 KB

english, 2014

50

Development of a Technique for Characterizing Bias Temperature Instability-Induced Device-to-Device Variation at SRAM-Relevant Conditions

Meng Duan,, Jian Fu Zhang,, Zhigang Ji,, Wei Dong Zhang,, Kaczer, Ben, Schram, Tom, Ritzenthaler, Romain, Groeseneken, Guido, Asenov, Asen

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.95 MB

english, 2014

51

Thermoreflectance CCD Imaging of Self-Heating in Power MOSFET Arrays

Maize, Kerry, Ziabari, Amirkoushyar, French, William D., Lindorfer, Philipp, OConnell, Barry, Shakouri, Ali

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.28 MB

english, 2014

52

Table of contents

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 160 KB

english, 2014

53

Special issue on variation aware technology and circuit co design

Journal:

IEEE Transactions on Electron Devices

Year:

2014

File:

PDF, 279 KB

2014

54

IEEE Transactions on Electron Devices publication information

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 152 KB

english, 2014

55

An Integrated a-IGZO UHF Energy Harvester for Passive RFID Tags

Chasin, Adrian, Volskiy, Vladimir, Libois, Michael, Myny, Kris, Nag, Manoj, Rockele, Maarten, Vandenbosch, Guy A. E., Genoe, Jan, Gielen, Georges, Heremans, Paul

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.07 MB

english, 2014

56

IEEE Transactions on Electron Devices information for authors

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 110 KB

english, 2014

57

2015 IEEE international reliability physics symposium

Journal:

IEEE Transactions on Electron Devices

Year:

2014

File:

PDF, 1.36 MB

2014

58

Special issue of IEEE transactions on electron devices on solid-state image sensors

Journal:

IEEE Transactions on Electron Devices

Year:

2014

File:

PDF, 293 KB

2014

59

Blank page

Journal:

IEEE Transactions on Electron Devices

Year:

2014

File:

PDF, 5 KB

2014

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