Trip-Point Bit-Line Precharge Sensing Scheme for...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015 / 7 Vol. 23; Iss. 7

Trip-Point Bit-Line Precharge Sensing Scheme for Single-Ended SRAM

Jeong, Hanwool, Kim, Taewon, Song, Taejoong, Kim, Gyuhong, Jung, Seong-Ook
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Volume:
23
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2014.2337958
Date:
July, 2015
File:
PDF, 1.30 MB
english, 2015
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