Low temperature channeling measurements of ion implantation...

Low temperature channeling measurements of ion implantation lattice disorder in single crystal silicon

Picraux, S. T., Weisenbergers, W. H., Vook, F. L.
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Volume:
7
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337577108232569
Date:
January, 1971
File:
PDF, 691 KB
english, 1971
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