Heavy Ion Testing and Single Event Upset Rate Prediction...

IEEE Transactions on Nuclear Science 2009 / 12 Vol. 56; Iss. 6

Heavy Ion Testing and Single Event Upset Rate Prediction Considerations for a DICE Flip-Flop

Warren, Kevin M., Sternberg, Andrew L., Black, Jeffrey D., Weller, Robert A., Reed, Robert A., Mendenhall, Marcus H., Schrimpf, Ronald D., Massengill, Lloyd W.
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Volume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2009.2034146
Date:
December, 2009
File:
PDF, 576 KB
english, 2009
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