Overestimation of Short-Channel Effects Due to Intergate...

IEEE Transactions on Electron Devices 2014 / 9 Vol. 61; Iss. 9

Overestimation of Short-Channel Effects Due to Intergate Coupling in Advanced FD-SOI MOSFETs

Navarro, Carlos, Bawedin, Maryline, Andrieu, Francois, Cristoloveanu, Sorin
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2338081
Date:
September, 2014
File:
PDF, 3.33 MB
english, 2014
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