An improved standard total dose test for CMOS space...

IEEE Transactions on Nuclear Science 1989 / Dec. Vol. 36; Iss. 6

An improved standard total dose test for CMOS space electronics

Fleetwood, D.M., Winokur, P.S., Riewe, L.C., Pease, R.L.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45393
Date:
January, 1989
File:
PDF, 829 KB
english, 1989
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