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Influence of Illumination on the Negative-Bias Stability of Transparent Hafnium–Indium–Zinc Oxide Thin-Film Transistors
Joon Seok Park,, Tae Sang Kim,, Kyoung Seok Son,, Ji Sim Jung,, Kwang-Hee Lee,, Jang-Yeon Kwon,, Bonwon Koo,, Sangyoon Lee,Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2010.2043050
Date:
May, 2010
File:
PDF, 198 KB
english, 2010