Radiation damage studies of silicon microstrip sensors

IEEE Transactions on Nuclear Science 2000 / Dec. Vol. 47; Iss. 6

Radiation damage studies of silicon microstrip sensors

Nakayama, T., Arai, S., Hara, K., Shimojima, M., Ikegami, Y., Iwata, Y., Johansen, L.G., Kobayashi, H., Kohriki, T., Kondo, T., Nakano, I., Ohsugi, T., Riedler, P., Roe, S., Stapnes, S., Stugu, B., Ta
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Volume:
47
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.914464
Date:
January, 2000
File:
PDF, 680 KB
english, 2000
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