Pseudo-MOSFET Drain-Current Transients: Influence of the...

IEEE Electron Device Letters 2009 / 09 Vol. 30; Iss. 9

Pseudo-MOSFET Drain-Current Transients: Influence of the Substrate

Kihoon Park,, Nayak, P., Schroder, D.K.
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Volume:
30
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2027719
Date:
September, 2009
File:
PDF, 369 KB
english, 2009
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