Coexistence of Memristive Behaviors and Negative...

IEEE Electron Device Letters 2012 / 06 Vol. 33; Iss. 6

Coexistence of Memristive Behaviors and Negative Capacitance Effects in Single-Crystal $\hbox{TiO}_{2}$ Thin-Film-Based Devices

Hu, P., Lu, J. Q., Wu, S. X., Lv, Q. B., Li, S. W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
33
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2012.2191133
Date:
June, 2012
File:
PDF, 316 KB
english, 2012
Conversion to is in progress
Conversion to is failed