On Test Compaction of Broadside and Skewed-Load Test Cubes

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2013 / 09 Vol. 21; Iss. 9

On Test Compaction of Broadside and Skewed-Load Test Cubes

Pomeranz, Irith
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Volume:
21
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2012.2217360
Date:
September, 2013
File:
PDF, 270 KB
english, 2013
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