Understanding the effects of wave function penetration on the inversion layer capacitance of NMOSFETs
Mudanai, S., Register, L.F., Tasch, A.F., Banerjee, S.K.Volume:
22
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.910624
Date:
March, 2001
File:
PDF, 57 KB
english, 2001