Interface trap formation via the two-stage H/sup +/ process

IEEE Transactions on Nuclear Science 1989 / Dec. Vol. 36; Iss. 6

Interface trap formation via the two-stage H/sup +/ process

Saks, N.S., Brown, D.B.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45378
Date:
January, 1989
File:
PDF, 1.10 MB
english, 1989
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