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Comparison of MOS capacitor and transistor postirradiation response
McWhorter, P.J., Fleetwood, D.M., Pastorek, R.A., Zimmerman, G.T.Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45371
Date:
January, 1989
File:
PDF, 888 KB
english, 1989