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Single event upset and hardening in 0.15 μm antifuse-based field programmable gate array
Wang, J.J., Wong, W., Wolday, S., Cronquist, B., McCollum, J., Katz, R., Kleyner, I.Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.822090
Date:
December, 2003
File:
PDF, 611 KB
english, 2003