Study of the Erase Mechanism of MANOS ($...

IEEE Electron Device Letters 2007 / 07 Vol. 28; Iss. 7

Study of the Erase Mechanism of MANOS ($ \hbox{Metal/Al}_{2}\hbox{O}_{3}/\hbox{SiN/SiO}_{2}/\hbox{Si}$) Device

Sheng-Chih Lai,, Hang-Ting Lue,, Jong-Yu Hsieh,, Ming-Jui Yang,, Yan-Kai Chiou,, Chia-Wei Wu,, Tai-Bor Wu,, Guang-Li Luo,, Chao-Hsin Chien,, Erh-Kun Lai,, Kuang-Yeu Hsieh,, Rich Liu,, Chih
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Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.899993
Date:
July, 2007
File:
PDF, 323 KB
english, 2007
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