Automatic test program generation: a case study

IEEE Design & Test of Computers 2004 / 03 Vol. 21; Iss. 2

Automatic test program generation: a case study

Corno, F., Sanchez, E., Reorda, M.S., Squillero, G.
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Volume:
21
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2004.1277902
Date:
March, 2004
File:
PDF, 289 KB
english, 2004
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