Volume 21; Issue 2

IEEE Design & Test of Computers

Volume 21; Issue 2
2

Automatic test program generation: a case study

Corno, F., Sanchez, E., Reorda, M.S., Squillero, G.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 289 KB
english, 2004
3

Policies and procedures-who needs them?

Ashenden, P.J.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 225 KB
english, 2004
4

Past successes, future challenges

Gupta, R.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 269 KB
english, 2004
5

Validating the itanium 2 exception control unit: a unit-level approach

Scafidi, C., Gibson, J.D., Bhatia, R.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 290 KB
english, 2004
6

Design for manufacturability [ITC 2003 Roundtable]

Xiaohai Li,, Yu Wang,, Jizhong Xiao,
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 433 KB
english, 2004
7

ITC 2003 panels: Part 1 [Panel Summaries]

Stolicny, C.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 321 KB
english, 2004
8

IEEE Computer Society Information

Pekarik, J.J., Kroemer, H., English, J.H.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 218 KB
english, 2004
9

The verification and test of complex digital ICs [Guest Editor's Introduction]

Abadir, M.S., Wang, L.-C.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 227 KB
english, 2004
10

IEEE Design and Test Editorial Calendar

Weiqiang Wang,, Ying Ding,, Chunqing Wang,
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 181 KB
english, 2004
11

Serving a growing community: how D&T began

Russo, R.L.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 192 KB
english, 2004
14

Southwest Test Workshop 2004 [Conference Reports]

Mann, W.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 196 KB
english, 2004
16

A message for the chair

Willis, J.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 188 KB
english, 2004
17

Verification evolution or industrial revolution?

Varma, P.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 193 KB
english, 2004
18

IEEE Security & Privacy Magazine

Freeman, Gordon R.
Journal:
IEEE Design & Test of Computers
Year:
2004
File:
PDF, 1.64 MB
2004
19

Test technology TC newsletter

Ayala, Claudia, Franch, Xavier
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 264 KB
english, 2004
20

A top-down methodology for microprocessor validation

Mishra, P., Nikil Dutt,, Krishnamurthy, N., Abadir, M.S.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 329 KB
english, 2004
21

Advertiser/Product Index

Bodkhe, S.B., Aware, M. V.
Journal:
IEEE Design & Test of Computers
Year:
2004
Language:
english
File:
PDF, 232 KB
english, 2004