Chip-level soft error estimation method

IEEE Transactions on Device and Materials Reliability 2005 / 09 Vol. 5; Iss. 3

Chip-level soft error estimation method

Nguyen, H.T., Yagil, Y., Seifert, N., Reitsma, M.
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Volume:
5
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2005.858334
Date:
September, 2005
File:
PDF, 556 KB
english, 2005
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