Volume 5; Issue 3

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IEEE Transactions on Device and Materials Reliability
Volume 5; Issue 3

IEEE Transactions on Device and Materials Reliability

Volume 5; Issue 3

1

Challenges and constraints in designing implantable medical ICs

Gerrish, P., Herrmann, E., Tyler, L., Walsh, K.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 1.31 MB

english, 2005

2

Cache and memory error detection, correction, and reduction techniques for terrestrial servers and workstations

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 293 KB

english, 2005

3

Radiation-induced soft errors in advanced semiconductor technologies

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 381 KB

english, 2005

4

The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs

Lesea, A., Drimer, S., Fabula, J.J., Carmichael, C., Alfke, P.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 1.12 MB

english, 2005

5

Circuit-level modeling of soft errors in integrated circuits

Walstra, S.V., Changhong Dai,

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 290 KB

english, 2005

6

Physics-based simulation of single-event effects

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 955 KB

english, 2005

7

Reliability aspects of packaging and integration technology for microfluidic systems

Ki-Ho Han,, Frazier, A.B.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 359 KB

english, 2005

8

A new technique to measure the thermal resistance of LDMOS transistors

Menozzi, R., Kingswood, A.C.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 220 KB

english, 2005

9

Impacts of front-end and middle-end process modifications on terrestrial soft error rate

Roche, P., Gasiot, G.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 987 KB

english, 2005

10

Design for soft error mitigation

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 234 KB

english, 2005

11

Chip-level soft error estimation method

Nguyen, H.T., Yagil, Y., Seifert, N., Reitsma, M.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 556 KB

english, 2005

12

Introduction to the Special Issue on Medical Electronics

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 28 KB

english, 2005

13

IBM z990 soft error detection and recovery

Meaney, P.J., Swaney, S.B., Sanda, P.N., Spainhower, L.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 611 KB

english, 2005

14

Asymmetries in soft-error rates in a large cluster system

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 354 KB

english, 2005

15

Introduction to the Special Issue on Soft Errors and Data Integrity in Terrestrial Computer Systems

Maiz, J., Seifert, N.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 33 KB

english, 2005

16

Cancer-radiotherapy equipment as a cause of soft errors in electronic equipment

Wilkinson, J.D., Bounds, C., Brown, T., Gerbi, B.J., Peltier, J.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 181 KB

english, 2005

17

Value-added medical-device risk management

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 92 KB

english, 2005

18

Reliability in deep brain stimulation

Shill, H.A., Shetter, A.G.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 79 KB

english, 2005

19

A cautionary tale of soft errors induced by SRAM packaging materials

Wilkinson, J., Hareland, S.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 252 KB

english, 2005

20

Shielded channel double-gate MOSFET: a novel device for reliable nanoscale CMOS applications

Orouji, A.A., Kumar, M.J.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 281 KB

english, 2005

21

Long-term hermeticity and biological performance of anodically bonded glass-silicon implantable packages

Harpster, T.J., Nikles, S.A., Dokmeci, M.R., Najafi, K.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 825 KB

english, 2005

22

Numerical modeling of pacemaker interference in the electric-utility environment

Stuchly, M.A., Kavet, R.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 250 KB

english, 2005

23

A new method to extract HBT thermal resistance and its temperature and power dependence

Menozzi, R., Barrett, J., Ersland, P.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 501 KB

english, 2005

24

ESD protection design of low-voltage-triggered p-n-p devices and their failure modes in mixed-voltage I/O interfaces with signal levels higher than VDD and lower than VSS

Ming-Dou Ker,, Wei-Jen Chang,

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 751 KB

english, 2005

25

Effects of RF and DC stress on AlGaN/GaN MODFETs: a low-frequency noise-based investigation

Valizadeh, P., Pavlidis, D.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 526 KB

english, 2005

26

Critical aspect of curing epoxy adhesive: fiber pistoning of LC connector

Jongwoo Park,, Shin, D.-S., Delucca, J., Theis, C., Osenbach, J.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 426 KB

english, 2005

27

Predicting the number of fatal soft errors in Los Alamos national laboratory's ASC Q supercomputer

Michalak, S.E., Harris, K.W., Hengartner, N.W., Takala, B.E., Wender, S.A.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 170 KB

english, 2005

28

Circuit-level reliability requirements for Cu metallization

Alam, S.M., Gan, C.L., Wei, F.L., Thompson, C.V., Troxel, D.E.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 438 KB

english, 2005

29

MRI and implanted medical devices: basic interactions with an emphasis on heating

Nyenhuis, J.A., Sung-Min Park,, Kamondetdacha, R., Amjad, A., Shellock, F.G., Rezai, A.R.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 359 KB

english, 2005

30

Thermomechanical stress analysis and measurement in quasi-monolithic integration technology (QMIT)

Joodaki, M., Kompa, G., Hillmer, H.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 1.05 MB

english, 2005

31

Effects of hot-carrier stress on the performance of CMOS low-noise amplifiers

Naseh, S., Deen, M.J., Chih-Hung Chen,

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 364 KB

english, 2005

32

Temperature stability of ZnO thin film SAW device on fused quartz

Tomar, M., Gupta, V., Sreenivas, K., Mansingh, A.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 306 KB

english, 2005

33

Scanning laser ultrasonics experiments for in situ nondestructive analysis of integrated circuits

Andriamonje, G., Pouget, V., Ousten, Y., Lewis, D., Plano, B., Danto, Y.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 312 KB

english, 2005

34

Speed optimized diode-triggered SCR (DTSCR) for RF ESD protection of ultra-sensitive IC nodes in advanced technologies

Mergens, M.P.J., Russ, C.C., Verhaege, K.G., Armer, J., Jozwiak, P.C., Mohn, R.P., Keppens, B., Trinh, C.S.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 1.04 MB

english, 2005

35

Native-NMOS-Triggered SCR With Faster Turn-On Speed for Effective ESD Protection in a 0.13-$rm murm m$CMOS Process

Ker, M.-D., Hsu, K.-C.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 985 KB

english, 2005