The Influence of In/Zn Ratio on the Performance and Negative-Bias Instability of Hf–In–Zn–O Thin-Film Transistors Under Illumination
Kim, Hyun-Suk, Park, Joon Seok, Maeng, Wan-Joo, Son, Kyoung Seok, Kim, Tae Sang, Ryu, Myungkwan, Lee, Jiyoul, Lee, Jae Cheol, Ko, Gunwoo, Im, Seongil, Lee, Sang YoonVolume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2011.2160836
Date:
September, 2011
File:
PDF, 152 KB
english, 2011