The Effect of Dynamic Bias Stress on the Photon-Enhanced...

IEEE Electron Device Letters 2011 / 02 Vol. 32; Iss. 2

The Effect of Dynamic Bias Stress on the Photon-Enhanced Threshold Voltage Instability of Amorphous HfInZnO Thin-Film Transistors

Son, Kyoung-Seok, Kim, Hyun-Suk, Maeng, Wan-Joo, Jung, Ji-Sim, Lee, Kwang-Hee, Kim, Tae-Sang, Park, Joon Seok, Kwon, Jang-Yeon, Koo, Bonwon, Lee, Sang-Yoon
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Volume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2093867
Date:
February, 2011
File:
PDF, 342 KB
english, 2011
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