More Accurate and Reliable Extraction of Tunneling...

More Accurate and Reliable Extraction of Tunneling Resistance in Tunneling FET and Verification in Small-Signal Circuit Operation

Cho, Seongjae, Kang, In Man, Kim, Kyung Rok
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2278676
Date:
October, 2013
File:
PDF, 2.39 MB
english, 2013
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