More Accurate and Reliable Extraction of Tunneling Resistance in Tunneling FET and Verification in Small-Signal Circuit Operation
Cho, Seongjae, Kang, In Man, Kim, Kyung RokVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2278676
Date:
October, 2013
File:
PDF, 2.39 MB
english, 2013