A study of negative-bias temperature instability of SOI and...

IEEE Electron Device Letters 2005 / 05 Vol. 26; Iss. 5

A study of negative-bias temperature instability of SOI and body-tied FinFETs

Hyunjin Lee,, Choong-Ho Lee,, Donggun Park,, Yang-Kyu Choi,
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Volume:
26
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2005.846587
Date:
May, 2005
File:
PDF, 321 KB
english, 2005
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