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Experimental and TCAD Investigation of the Two Components of the Impact Ionization MOSFET (IMOS) Switching
Mayer, F., Le Royer, C., Le Carval, G., Clavelier, L., Deleonibus, S.Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.897876
Date:
July, 2007
File:
PDF, 297 KB
english, 2007