Safe Operating Area of GaAs MESFET for Nonlinear Applications
Malbert, N., Labat, N., Ismail, N., Touboul, A., Muraro, J.-L., Brasseau, F., Langrez, D.Volume:
6
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2006.877866
Date:
June, 2006
File:
PDF, 349 KB
english, 2006