A chip-level modeling approach for rail span collapse and...

IEEE Transactions on Nuclear Science 1989 / Dec. Vol. 36; Iss. 6

A chip-level modeling approach for rail span collapse and survivability analyses

Mavis, D.G., Alexander, D.R., Dinger, G.L.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45430
Date:
January, 1989
File:
PDF, 747 KB
english, 1989
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