A Josephson technology system level experiment

IEEE Electron Device Letters 1981 / 10 Vol. 2; Iss. 10

A Josephson technology system level experiment

Ketchen, M.B., van der Hoeven, B.J., Matisoo, J., Greiner, J.H., Herrell, D.J., Wang, R.H., Guernsey, R.W., Anderson, C.J., Arnett, P.C., Bermon, S., Bickford, H.R., Bright, A.A., Geldermans, P., Ghee
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Volume:
2
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/edl.1981.25426
Date:
October, 1981
File:
PDF, 597 KB
english, 1981
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