Radiation response of floating gate EEPROM memory cells

IEEE Transactions on Nuclear Science 1989 / Dec. Vol. 36; Iss. 6

Radiation response of floating gate EEPROM memory cells

Snyder, E.S., McWhorter, P.J., Dellin, T.A., Sweetman, J.D.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45415
Date:
January, 1989
File:
PDF, 838 KB
english, 1989
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