Temperature Dependence of the Threshold Voltage Shift...

IEEE Electron Device Letters 2011 / 06 Vol. 32; Iss. 6

Temperature Dependence of the Threshold Voltage Shift Induced by Carrier Injection in Integrated STI-Based LDMOS Transistors

Poli, Stefano, Reggiani, Susanna, Denison, Marie, Gnani, Elena, Gnudi, Antonio, Baccarani, Giorgio, Pendharkar, Sameer, Wise, Rick
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Volume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2011.2135835
Date:
June, 2011
File:
PDF, 313 KB
english, 2011
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