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Volume 32; Issue 6
Main
IEEE Electron Device Letters
Volume 32; Issue 6
IEEE Electron Device Letters
Volume 32; Issue 6
1
Channel-Length-Dependent Transport Behaviors of Graphene Field-Effect Transistors
Shu-Jen Han
,
Zhihong Chen
,
Bol, A.A.
,
Yanning Sun
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 679 KB
Your tags:
english, 2011
2
Crossbar Logic Using Bipolar and Complementary Resistive Switches
Rosezin, R.
,
Linn, E.
,
Kugeler, C.
,
Bruchhaus, R.
,
Waser, R.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 452 KB
Your tags:
english, 2011
3
Evidence of a Novel Source of Random Telegraph Signal in CMOS Image Sensors
Goiffon, V.
,
Magnan, P.
,
Martin-Gonthier, P.
,
Virmontois, C.
,
Gaillardin, M.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 353 KB
Your tags:
english, 2011
4
Capitalizing on the Glass-Etching Effect of Silver Plating Chemistry to Contact Si Solar Cells With Homogeneous 100–110 $\Omega/\hbox{sq}$ Emitters
Ebong, Abasifreke
,
Cooper, Ian B.
,
Rounsaville, Brian C.
,
Rohatgi, Ajeet
,
Dovrat, Miki
,
Kritchman, Eli
,
Brusilovsky, David
,
Benichou, Axel
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 450 KB
Your tags:
english, 2011
5
245-GHz InAlN/GaN HEMTs With Oxygen Plasma Treatment
Lee, Dong Seup
,
Chung, Jinwook W.
,
Wang, Han
,
Gao, Xiang
,
Guo, Shiping
,
Fay, Patrick
,
Palacios, Tomás
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 329 KB
Your tags:
english, 2011
6
Modeling of Current-Return-Path Effect on Single-Ended Inductor in Millimeter-Wave Regime
H. Wang
,
L. Zhang
,
D. Yang
,
D. Zeng
,
Y. Wang
,
Z. Yu
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 368 KB
Your tags:
english, 2011
7
Modeling and Separate Extraction of Gate-Bias- and Channel-Length-Dependent Intrinsic and Extrinsic Source–Drain Resistances in MOSFETs
H. Bae
,
J. Jang
,
J. S. Shin
,
D. Yun
,
J. Lee
,
T. W. Kim
,
D. H. Kim
,
D. M. Kim
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 698 KB
Your tags:
english, 2011
8
Very Low Reset Current for an RRAM Device Achieved in the Oxygen-Vacancy-Controlled Regime
N. Raghavan
,
K. L. Pey
,
X. Li
,
W. H. Liu
,
X. Wu
,
M. Bosman
,
T. Kauerauf
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 674 KB
Your tags:
english, 2011
9
High-Performance Amorphous Indium–Gallium–Zinc–Oxide Thin-Film Transistor With a Self-Aligned Etch Stopper Patterned by Back-Side UV Exposure
D. Geng
,
D. H. Kang
,
J. Jang
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 367 KB
Your tags:
english, 2011
10
Wang, Nan
,
Tsai, J. M.
,
Hsiao, Fu-Li
,
Soon, B. W.
,
Kwong, Dim-Lee
,
Palaniapan, Moorthi
,
Lee, Chengkuo
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 293 KB
Your tags:
english, 2011
11
$hbox{Al}_{2} hbox{O}_{3}$/n-InAs Metal–Oxide–Semiconductor Capacitors With Various Surface Treatments]]>
Trinh, H. D.
,
Brammertz, G.
,
Chang, E. Y.
,
Kuo, C. I.
,
Lu, C. Y.
,
Lin, Y. C.
,
Nguyen, H. Q.
,
Wong, Y. Y.
,
Tran, B. T.
,
Tran, K.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 379 KB
Your tags:
english, 2011
12
Enhanced Power and Breakdown in III-N RF Switches With a Slow Gate
Sattu, A.
,
Deng, J.
,
Billingsley, D.
,
Yang, J.
,
Shur, M.
,
Gaska, R.
,
Simin, G.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 159 KB
Your tags:
english, 2011
13
Improved Uniformity of Sequential Lateral Solidification Thin-Film Transistors
Kang, Myung-Koo
,
Kim, Si Joon
,
Kim, Hyun Jae
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 383 KB
Your tags:
english, 2011
14
Unipolar Resistive Switching Properties of Diamondlike Carbon-Based RRAM Devices
Fu, Di
,
Xie, Dan
,
Feng, Tingting
,
Zhang, Chenhui
,
Niu, Jiebin
,
Qian, He
,
Liu, Litian
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 373 KB
Your tags:
english, 2011
15
Mechanism Analysis of Off-Leakage Current in an LDD Poly-Si TFT Using Activation Energy
Nakashima, Akihiro
,
Kimura, Mutsumi
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 472 KB
Your tags:
english, 2011
16
Junctionless Vertical-Si-Nanowire-Channel-Based SONOS Memory With 2-Bit Storage per Cell
Sun, Y.
,
Yu, H. Y.
,
Singh, N.
,
Leong, K. C.
,
Lo, G. Q.
,
Kwong, D. L.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 383 KB
Your tags:
english, 2011
17
RF Model and Verification of Through-Silicon Vias in Fully Integrated SiGe Power Amplifier
Liao, Hsien-Yuan
,
Chiou, Hwann-Kaeo
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 360 KB
Your tags:
english, 2011
18
Monolithic Integration of a 4H-Silicon Carbide Vertical JFET and a JBS Diode
Radhakrishnan, Rahul
,
Zhao, Jian H.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 203 KB
Your tags:
english, 2011
19
Impact of NBTI/PBTI on SRAM Stability Degradation
Cheng, Binjie
,
Brown, Andrew R.
,
Asenov, Asen
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 539 KB
Your tags:
english, 2011
20
TiN Thickness Impact on BTI Performance
Chen, Chien Liang
,
King, Ya-Chin
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 438 KB
Your tags:
english, 2011
21
New Leakage Mechanism and Dielectric Breakdown Layer Detection in Metal-Nanocrystal-Embedded Dual-Layer Memory Gate Stack
Lwin, Zin Zar
,
Pey, Kin Leong
,
Raghavan, Nagarajan
,
Chen, Yining
,
Mahapatra, Souvik
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 354 KB
Your tags:
english, 2011
22
Enhancement of Resistive Switching Characteristics in $ \hbox{Al}_{2}\hbox{O}_{3}$-Based RRAM With Embedded Ruthenium Nanocrystals
Chen, Lin
,
Gou, Hong-Yan
,
Sun, Qing-Qing
,
Zhou, Peng
,
Lu, Hong-Liang
,
Wang, Peng-Fei
,
Ding, Shi-Jin
,
Zhang, DavidWei
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 320 KB
Your tags:
english, 2011
23
Thermal Sensing With Lithographically Patterned Bimetallic Thin-Film Thermocouples
Varrenti, Andrew R.
,
Zhou, Chuanle
,
Klock, A. Grace
,
Chyung, Seung H.
,
Long, Jieyi
,
Memik, Seda Ogrenci
,
Grayson, M.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 139 KB
Your tags:
english, 2011
24
High-Performance Poly-Si Vertical Nanowire Thin-Film Transistor and the Inverter Demonstration
Le, T. T.
,
Yu, H. Y.
,
Sun, Y.
,
Singh, N.
,
Zhou, X.
,
Shen, N.
,
Lo, G. Q.
,
Kwong, D. L.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 473 KB
Your tags:
english, 2011
25
Effects of Surface Orientation on the Performance of Idealized III–V Thin-Body Ballistic n-MOSFETs
Kim, Raseong
,
Rakshit, Titash
,
Kotlyar, Roza
,
Hasan, Sayed
,
Weber, Cory E.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 333 KB
Your tags:
english, 2011
26
Amorphous-Selenium-Based Three-Terminal X-Ray Detector With a Gate
Wang, Kai
,
Chen, Feng
,
Allec, Nicholas
,
Yuan, Fang
,
Belev, George
,
Kasap, Safa
,
Karim, Karim S.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 403 KB
Your tags:
english, 2011
27
CMOS Inverter Based on Schottky Source–Drain MOS Technology With Low-Temperature Dopant Segregation
Larrieu, Guilhem
,
Dubois, Emmanuel
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 352 KB
Your tags:
english, 2011
28
Temperature Dependence of the Threshold Voltage Shift Induced by Carrier Injection in Integrated STI-Based LDMOS Transistors
Poli, Stefano
,
Reggiani, Susanna
,
Denison, Marie
,
Gnani, Elena
,
Gnudi, Antonio
,
Baccarani, Giorgio
,
Pendharkar, Sameer
,
Wise, Rick
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 313 KB
Your tags:
english, 2011
29
Performance Improvement of a Virtual-Ground Nonvolatile Charge-Trap Storage nor-Type Memory Cell With Optimized Junction Dosage for 45-nm Generation Node
Ou, T. F.
,
Tzeng, W. C.
,
Tsai, C. H.
,
Lee, G. D.
,
Ku, S. H.
,
Liu, C. H.
,
Liu, K. W.
,
Zous, N. K.
,
Huang, S. W.
,
Chen, M. S.
,
Lu, W. P.
,
Chen, K. C.
,
Lu, Chih-Yuan
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 458 KB
Your tags:
english, 2011
30
Low-Temperature Reflow Anneals of Cu on Ru
Yang, C.-C.
,
McFeely, F. R.
,
Li, B.
,
Rosenberg, R.
,
Edelstein, D.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 255 KB
Your tags:
english, 2011
31
Aggressively Scaled Strained-Silicon-on-Insulator Undoped-Body High- $\kappa$/Metal-Gate nFinFETs for High-Performance Logic Applications
Maitra, Kingsuk
,
Khakifirooz, Ali
,
Kulkarni, Pranita
,
Basker, Veeraraghavan S.
,
Faltermeier, Jonathan
,
Jagannathan, Hemanth
,
Adhikari, Hemant
,
Yeh, Chun-Chen
,
Klymko, Nancy R.
,
Saenger, Katherine
,
Sta
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 408 KB
Your tags:
english, 2011
32
A SiC Varactor With Large Effective Tuning Range for Microwave Power Applications
Andersson, Christer M.
,
Ejebjork, Niclas
,
Henry, Anne
,
Andersson, Sven
,
Janzen, Erik
,
Zirath, Herbert
,
Rorsman, Niklas
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 250 KB
Your tags:
english, 2011
33
Simple Analytical Bulk Current Model for Long-Channel Double-Gate Junctionless Transistors
Duarte, Juan P.
,
Choi, Sung-Jin
,
Moon, Dong-Il
,
Choi, Yang-Kyu
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 390 KB
Your tags:
english, 2011
34
Extraction of Separated Source and Drain Resistances in Amorphous Indium–Gallium–Zinc Oxide TFTs Through $C$– $V$ Characterization
Bae, Hagyoul
,
Kim, Sungchul
,
Bae, Minkyung
,
Shin, Ja Sun
,
Kong, Dongsik
,
Jung, Hyunkwang
,
Jang, Jaeman
,
Lee, Jieun
,
Kim, Dae Hwan
,
Kim, Dong Myong
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 457 KB
Your tags:
english, 2011
35
Scaling and Anisotropic Conduction in Electrochemically Deposited Polypyrrole Hybrid Junctions
Pilapil, Matt A.
,
Pillai, Rajesh G.
,
Freund, Michael S.
,
Zhao, Jun Hui
,
Thomson, Douglas J.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 121 KB
Your tags:
english, 2011
36
Stepped Broken-Gap Heterobarrier Tunneling Field-Effect Transistor for Ultralow Power and High Speed
Register, Leonard F.
,
Hasan, Mohammad M.
,
Banerjee, Sanjay K.
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 377 KB
Your tags:
english, 2011
37
Reset Instability in Pulsed-Operated Unipolar Resistive-Switching Random Access Memory Devices
Nardi, Federico
,
Cagli, Carlo
,
Spiga, Sabina
,
Ielmini, Daniele
Journal:
IEEE Electron Device Letters
Year:
2011
Language:
english
File:
PDF, 283 KB
Your tags:
english, 2011
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