High-Performance Double-Layer Nickel Nanocrystal Memory by Ion Bombardment Technique
Liu, Sheng-Hsien, Yang, Wen-Luh, Lin, Yu-Hsien, Wu, Chi-Chang, Chao, Tien-ShengVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2279156
Date:
October, 2013
File:
PDF, 1.50 MB
english, 2013