Analysis of Failure Mechanisms and Extraction of Activation...

IEEE Electron Device Letters 2013 / 01 Vol. 34; Iss. 1

Analysis of Failure Mechanisms and Extraction of Activation Energies $(E_{a})$ in 21-nm nand Flash Cells

Lee, Kyunghwan, Kang, Myounggon, Seo, Seongjun, Li, Dong Hua, Kim, Jungki, Shin, Hyungcheol
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2012.2222013
Date:
January, 2013
File:
PDF, 509 KB
english, 2013
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