Volume 34; Issue 1

IEEE Electron Device Letters

Volume 34; Issue 1

1

AlGaN/GaN HEMTs on Silicon Substrate With 206-GHz $F_{ \rm MAX}$

Bouzid-Driad, S., Maher, H., Defrance, N., Hoel, V., De Jaeger, J.-C., Renvoise, M., Frijlink, P.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 293 KB

english, 2013

2

Flexible Complementary Logic Gates Using Inkjet-Printed Polymer Field-Effect Transistors

Baeg, Kang-Jun, Khim, Dongyoon, Kim, Juhwan, Kim, Dong-Yu, Sung, Si-Woo, Yang, Byung-Do, Noh, Yong-Young

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 526 KB

english, 2013

3

Normally Off Single-Nanoribbon $\hbox{Al}_{2} \hbox{O}_{3}\hbox{/GaN}$ MISFET

Im, Ki-Sik, Kim, Ryun-Hwi, Kim, Ki-Won, Kim, Dong-Seok, Lee, Chun Sung, Cristoloveanu, Sorin, Lee, Jung-Hee

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 372 KB

english, 2013

4

GIDL in Doped and Undoped FinFET Devices for Low-Leakage Applications

Kerber, Pranita, Zhang, Qintao, Koswatta, Siyuranga, Bryant, Andres

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 503 KB

english, 2013

5

Silicon-Embedded Receiving Coil for High-Efficiency Wireless Power Transfer to Implantable Biomedical ICs

Wu, Rongxiang, Raju, Salahuddin, Chan, Mansun, Sin, Johnny K. O., Yue, C. Patrick

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 258 KB

english, 2013

6

A Gate Overdrive Protection Technique for Improved Reliability in AlGaN/GaN Enhancement-Mode HEMTs

Kwan, Alex Man Ho, Chen, Kevin J.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 556 KB

english, 2013

7

Influence of the Interface Acceptor-Like Traps on the Transient Response of AlGaN/GaN HEMTs

Zhang, Wei, Zhang, Yue, Mao, Wei, Ma, XiaoHua, Zhang, JinCheng, Hao, Yue

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 176 KB

english, 2013

8

Dielectric Stacking Effect of $\hbox{Al}_{2} \hbox{O}_{3}$ and $\hbox{HfO}_{2}$ in Metal–Insulator–Metal Capacitor

Park, In-Sung, Ryu, Kyoung-min, Jeong, Jaehack, Ahn, Jinho

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 289 KB

english, 2013

9

Novel Bipolar-Enhanced Tunneling FET With Simulated High On-Current

Wan, J., Zaslavsky, A., Le Royer, C., Cristoloveanu, S.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 551 KB

english, 2013

10

SiNW-CMOS Hybrid Common-Source Amplifier as a Voltage-Readout Hydrogen Ion Sensor

Lee, Jieun, Lee, Jin-Moo, Lee, Jung Han, Uhm, Mihee, Lee, Won Hee, Hwang, Seonwook, Chung, In-Young, Park, Byung-Gook, Kim, Dong Myong, Jeong, Yong-Joo, Kim, Dae Hwan

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 557 KB

english, 2013

11

Uniform Complementary Resistive Switching in Tantalum Oxide Using Current Sweeps

Schmelzer, S., Linn, E., Bottger, U., Waser, R.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 601 KB

english, 2013

12

2-kV and 1.5-kA Semi-Insulating GaAs Photoconductive Semiconductor Switch

Shi, Wei, Fu, Zhanglong

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 477 KB

english, 2013

13

A New LDMOSFET with Tunneling Junction for Improved On-State Performance

Goyal, Nitin, Saxena, Raghvendra Sahai

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 244 KB

english, 2013

14

$\hbox{In}_{0.53}\hbox{Ga}_{0.47}\hbox{As}$ Planar Gunn Diodes Operating at a Fundamental Frequency of 164 GHz

Khalid, Ata, Li, C., Papageogiou, V., Dunn, G. M., Steer, M. J., Thayne, I. G., Kuball, M., Oxley, C. H., Montes Bajo, M., Stephen, A., Glover, J., Cumming, D. R. S.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 281 KB

english, 2013

15

Contact-Length-Dependent Contact Resistance of Top-Gate Staggered Organic Thin-Film Transistors

Wang, Hong, Li, Ling, Ji, Zhuoyu, Lu, Congyan, Guo, Jingwei, Wang, Long, Liu, Ming

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 344 KB

english, 2013

16

Origins of Low-Frequency Noise and Interface Traps in 4H-SiC MOSFETs

Zhang, Cher Xuan, Zhang, En Xia, Fleetwood, Daniel M., Schrimpf, Ronald D., Dhar, Sarit, Ryu, Sei-Hyung, Shen, Xiao, Pantelides, Sokrates T.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 502 KB

english, 2013

17

Electrical and Reliability Investigation of Cu TSVs With Low-Temperature Cu/Sn and BCB Hybrid Bond Scheme

Chang, Yao-Jen, Ko, Cheng-Ta, Chen, Kuan-Neng

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 396 KB

english, 2013

18

P-N Junction of NiO Thin Film for Photonic Devices

Tyagi, Manisha, Tomar, Monika, Gupta, Vinay

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 423 KB

english, 2013

19

Analysis of Failure Mechanisms and Extraction of Activation Energies $(E_{a})$ in 21-nm nand Flash Cells

Lee, Kyunghwan, Kang, Myounggon, Seo, Seongjun, Li, Dong Hua, Kim, Jungki, Shin, Hyungcheol

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 509 KB

english, 2013

20

On the Impact of Through-Silicon-Via-Induced Stress on 65-nm CMOS Devices

Weerasekera, Roshan, Li, Hong Yu, Yi, Lim Wei, Sanming, Hu, Shi, Jinglin, Minkyu, Je, Teo, Keng Hwa

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 558 KB

english, 2013

21

Effects of Thermal Annealing on In Situ Phosphorus-Doped Germanium $\hbox{n}^{+}/\hbox{p}$ Junction

Shim, Jaewoo, Song, I., Jung, W.-S., Nam, J., Leem, J. W., Yu, J. S., Kim, D. E., Cho, W. J., Kim, Y. S., Jun, D.-H., Heo, J., Park, W., Park, Jin-Hong, Saraswat, K. C.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 404 KB

english, 2013

22

Composition-Graded AlInP/AlGaAsSb/InP Type-II DHBTs With $f_{T}/f_{\rm MAX} = \hbox{450/510}\ \hbox{GHz}$

Xu, Huiming, Iverson, Eric W., Liao, Chi-Chih, Cheng, K. Y., Feng, Milton

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 394 KB

english, 2013

23

Scaled Gate Stacks for Sub-20-nm CMOS Logic Applications Through Integration of Thermal IL and ALD HfOx

Joshi, K., Hung, S., Mukhopadhyay, S., Sato, T., Bevan, M., Rajamohanan, B., Wei, A., Noori, A., McDougall, B., Ni, C., Lazik, C., Saheli, G., Liu, P., Chu, D., Date, L., Datta, S., Brand, A., Swenber

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 465 KB

english, 2013

24

Implant Isolation of Silicon Two-Dimensional Electron Gases at 4.2 K

Huang, Chiao-Ti, Li, Jiun-Yun, Sturm, James C.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 301 KB

english, 2013

25

Demonstration of Addressable Organic Resistive Memory Utilizing a PC-Interface Memory Cell Tester

Cho, Byungjin, Song, Sunghoon, Ji, Yongsung, Choi, Ho-Gil, Ko, Heung Cho, Lee, Jae-Suk, Jung, Gun-Young, Lee, Takhee

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 448 KB

english, 2013

26

Temperature Sensing Scheme Through Random Telegraph Noise in Contact RRAM

Chang, Liang-Shun, Huang, Chien-Yuan, Tseng, Yuan-Heng, King, Ya-Chin, Lin, Chrong-Jung

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 384 KB

english, 2013

27

Self-Heating-Effect-Induced Degradation Behaviors in a-InGaZnO Thin-Film Transistors

Hsieh, Tien-Yu, Chang, Ting-Chang, Chen, Te-Chih, Chen, Yu-Te, Tsai, Ming-Yen, Chu, Ann-Kuo, Chung, Yi-Chen, Ting, Hung-Che, Chen, Chia-Yu

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 431 KB

english, 2013

28

Design of a Multifunctional Double-Active-Layer Thin-Film Transistor for Photosensing Applications

Han, Sang Youn, Jeon, Kyung Sook, Seo, Seung Mi, Seo, Mi Seon, Jung, Suk-Won

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 310 KB

english, 2013

29

Frequency Multiplexed MEMS Actuators and Switches

Wang, Minfeng, Zhang, Yang, Li, G. P., Bachman, Mark

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 611 KB

english, 2013

30

Electrical Characteristics of $\hbox{Ba}_{0.6}\hbox{Sr}_{0.4} \hbox{TiO}_{3}$ Thin-Film Chip Capacitors for Embedded Passive Components

Rahayu, Rheza, Kang, Min-Gyu, Do, Young-Ho, Hwang, Jin-Ha, Kang, Chong-Yun, Yoon, Seok-Jin

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 329 KB

english, 2013

31

Ultralow-Voltage Solution-Processed Organic Transistors With Small Gate Dielectric Capacitance

Feng, Linrun, Tang, Wei, Xu, Xiaoli, Cui, Qingyu, Guo, Xiaojun

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 306 KB

english, 2013

32

Fabrication, Novel Morphology, and Field Emission Properties of $\hbox{Ga}_{2}\hbox{O}_{3}/\hbox{In}_{2}\hbox{O}_{3}$ Core-Shell Nanowires

Hsu, Cheng-Liang, Liu, Shin, Tsai, Tsung-Ying, Chen, Kuan-Chao

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 533 KB

english, 2013

33

Performance Improvement of Low-Band-Gap Polymer Solar Cells by Optical Microcavity Effect

Shen, Liang, Yu, Wenjuan, Long, Yongbing, Guo, Wenbin, Meng, Fanxu, Ruan, Shengping, Chen, Weiyou

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 349 KB

english, 2013

34

Electrically Driven Diffraction Grating Designed for Visible-Wavelength Region

Kim, Sun Il, Choi, Jun Hee, Baik, Chan Wook, Ahn, Ho Young, Lee, Yun Sung, An, Jungkwuen, Choi, Chil-Sung, Pyun, Kyungsuk, Lee, Hong-Seok, Kwon, Deok-Hwang, Kim, Min-Kwan, Kim, Miyoung, Lee, Sangyoon

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 369 KB

english, 2013

35

Nonvolatile Multilevel Resistive Switching in $ \hbox{Ar}^{+}$ Irradiated $\hbox{BiFeO}_{3}$ Thin Films

Shuai, Y., Ou, X., Luo, W., Du, N., Wu, C., Zhang, W., Burger, D., Mayr, C., Schuffny, R., Zhou, S., Helm, M., Schmidt, H.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 687 KB

english, 2013

36

$I$–$V$ Characteristics of Antiparallel Resistive Switches Observed in a Single $\hbox{Cu/TaO}_{x}\hbox{/Pt}$ Cell

Liu, Tong, Verma, Mohini, Kang, Yuhong, Orlowski, Marius K.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 354 KB

english, 2013

37

High-Performance Polyimide-Based ReRAM for Nonvolatile Memory Application

Liu, Sheng-Hsien, Yang, Wen-Luh, Wu, Chi-Chang, Chao, Tien-Sheng, Ye, Meng-Ru, Su, Yu-Yuan, Wang, Po-Yang, Tsai, Ming-Jui

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 363 KB

english, 2013

38

Twin Thin-Film Transistor Nonvolatile Memory With an Indium–Gallium–Zinc–Oxide Floating Gate

Hung, Min-Feng, Wu, Yung-Chun, Chang, Jiun-Jye, Chang-Liao, Kuei-Shu

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 329 KB

english, 2013

39

An Efficient Metal-Core Printed Circuit Board With a Copper-Filled Through (Blind) Hole for Light-Emitting Diodes

Wu, Je-Yi, Chen, Chih-Ming, Horng, Ray-Hua, Wuu, Dong-Sing

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 381 KB

english, 2013

40

Self-Aligned Indium–Gallium–Zinc Oxide Thin-Film Transistor With Source/Drain Regions Doped by Implanted Arsenic

Chen, Rongsheng, Zhou, Wei, Zhang, Meng, Wong, Man, Kwok, Hoi Sing

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 434 KB

english, 2013

41

Wafer-Bonded p-n Heterojunction of GaAs and Chemomechanically Polished N-Polar GaN

Kim, Jeonghee, Toledo, Nikholas G., Lal, Shalini, Lu, Jing, Buehl, Trevor E., Mishra, Umesh K.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 343 KB

english, 2013

42

Electrohydrodynamic Jet Spraying Technique for Oxide Thin-Film Transistor

Kwack, Young-Jin, Choi, Woon-Seop

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 451 KB

english, 2013

43

Extraction Technique for Intrinsic Subgap DOS in a-IGZO TFTs by De-Embedding the Parasitic Capacitance Through the Photonic $C$– $V$ Measurement

Bae, Hagyoul, Choi, Hyunjun, Oh, Saeroonter, Kim, Dae Hwan, Bae, Jonguk, Kim, Jaehyeong, Kim, Yun Hyeok, Kim, Dong Myong

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 478 KB

english, 2013

44

High-Mobility Solution-Processed Amorphous Indium Zinc $\hbox{Oxide/In}_{2}\hbox{O}_{3}$ Nanocrystal Hybrid Thin-Film Transistor

Wang, ChunLan, Liu, XingQiang, Xiao, XiangHeng, Liu, YueLi, Chen, Wen, Li, JinChai, Shen, GuoZhen, Liao, Lei

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 446 KB

english, 2013

45

Dual-Direction Nanocrossbar Array ESD Protection Structures

Wang, Li, Wang, Xin, Shi, Zitao, Ma, Rui, Liu, Jian, Dong, Zhongyu, Zhang, Chen, Lin, Lin, Zhao, Hui, Zhang, Lijie, Wang, Albert, Cheng, Yuhua, Huang, Ru

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 527 KB

english, 2013

46

Table of contents

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 64 KB

english, 2013

47

Special Issue on GaN Electronic Devices

Journal:

IEEE Electron Device Letters

Year:

2013

File:

PDF, 410 KB

2013

48

[Blank page - back cover]

Journal:

IEEE Electron Device Letters

Year:

2013

File:

PDF, 5 KB

2013

49

IEEE Electron Devices Society Meetings Calendar for 2012 (As of 11/15/2012)

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 45 KB

english, 2013

50

IEEE Electron Device Letters information for authors

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 111 KB

english, 2013

51

Open Access

Journal:

IEEE Electron Device Letters

Year:

2013

File:

PDF, 1.13 MB

2013

52

Proven powerful

Journal:

IEEE Electron Device Letters

Year:

2013

File:

PDF, 189 KB

2013

53

Table of contents

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 76 KB

english, 2013

54

IEEE Electron Device Letters publication information

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 149 KB

english, 2013

55

IEEE Foundation

Journal:

IEEE Electron Device Letters

Year:

2013

File:

PDF, 320 KB

2013

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Tor version

Z-Library

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски