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The nature of the trapped hole annealing process
Lelis, A.J., Oldham, T.R., Boesch, H.E., McLean, F.B.Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45373
Date:
January, 1989
File:
PDF, 859 KB
english, 1989