Thermal distribution during destructive pulses in ESD...

IEEE Transactions on Device and Materials Reliability 2003 / 12 Vol. 3; Iss. 4

Thermal distribution during destructive pulses in ESD protection devices using a single-shot two-dimensional interferometric method

Pogany, D., Bychikhin, S., Kuzmik, J., Dubec, V., Jensen, N., Denison, M., Groos, G., Stecher, M., Gornik, E.
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Volume:
3
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2003.818382
Date:
December, 2003
File:
PDF, 758 KB
english, 2003
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