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Silicon crystal distortions at the Si(1 0 0)–SiO2 interface from analysis of ion-scattering
Angelo Bongiorno, Alfredo Pasquarello, Mark S Hybertsen, L.C FeldmanVolume:
72
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.mee.2003.12.036
File:
PDF, 205 KB
english, 2004