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A compact DC model of gate oxide short defect
R. Bouchakour, J.M. Portal, J.M. Gallière, F. Azais, Y. Bertrand, M. RenovellVolume:
72
Year:
2004
Language:
english
Pages:
9
DOI:
10.1016/j.mee.2003.12.051
File:
PDF, 250 KB
english, 2004